The laboratories at Polymer Diagnostics, Inc. can provide quantitative inorganic and elemental information over a wide range of concentrations. By utilizing multiple techniques, we can study even microscopic samples and particles.
Inorganic analysis can be particularly effective at identifying even the most elusive contaminants and systems, which is why the techniques below are a critical facet of our failure analysis services.
X-ray Fluorescence Spectroscopy (XRF)
PDI scientists apply XRF to analyze solid, powdered or liquid samples in bulk for elemental composition from sodium to americium, with a detection range from 100% down to 10 parts per million. Our standard-less quantification system enables us to semi-quantitatively determine your material’s composition.
Our extensive body of experience in PVC and PE allows us to more accurately quantify inorganic additives in your polymer system.
Inductively Coupled Plasma – Optical Emission Spectroscopy gives us the power to quantify even the smallest contamination or additive in a system. The technique is accurate, precise and sensitive (down to a detection limit in the parts per billion).
Scanning Electron Microscope (SEM) Energy-dispersive X-ray Detection
By using a scanning electron microscope, we can conduct compositional analysis for elements with an atomic number greater than boron – even on small samples or small portions of a sample, such as failure sites or embedded particles.