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Optical Microscopy
The optical microscope is a basic tool for studying details of structure down to about 2 µm. Optical microscopes can be
equipped with numerous accessories to for the study of physical characteristics and chemical phenomena.
Applications
- Identification of contaminants
- Failure analysis
- Particle size/shape
- Degree of dispersion
- Absorption and swelling
- Refractive index measurement
- Thermal effects using hot stage
Sample
Nearly any sample can be
examined.
Scanning Electron Microscopy
Detailed images of a sample surface with considerable depth of focus can be obtained on solid specimens. Information can
be obtained regarding size, shape, and texture on many materials. Often used in conjunction with EDX.
Applications
- Fracture surface study
- Internal resin morphology
- Particle size/shape
- Polymer surface structure
- Filler/impact modifier
dispersion
- Contamination identification
Sample
- Any non-liquid sample less than 2” in thickness and diameter.
Transmission Electron Microscopy
The Transmission Electron Microscope (TEM) is used to examine the internal structure of multi-phase polymeric
materials by selectively staining one of the phases. This method requires the preparation of very thin sections
of the material to be examined. Sufficient contrast is usually available without staining - that means problems
of dispersion of fillers or other reinforcing minerals can also be investigated. The TEM is able to investigate
the structure of materials at an even smaller scale than is possible with the SEM.
Applications
- Examine dispersion and particle size of additives in polymer matrix
- Study phases of blends an alloys
Sample
- Very thin sections (0.1 µm thick) or replicas
Atomic Force Microscopy
Atomic Force Microscopy (AFM) can provide information about surface morphology, similar to the SEM, but at a much
higher resolution. To study surface topography by AFM, a small, sharp tip on the end of a flexible cantilever
is scanned across the sample while a constant force is maintained. Compositional information is obtained by
having the tip lightly tap the surface while scanning. The deflection of the cantilever is affected by the hardness
of the areas being scanned. For example, softer particles of impact modifier inside a harder matrix can be imaged.
Applications
- Examine dispersion and particle
size of additives in polymer matrix
- Study phases of blends and
alloys
- Image and quantify surface
texture or roughness (topography)
Sample
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